Products

ORBIT/FR Now Offering Select Post-Warranty Service Plans

Posted Apr, 12, 2012

We are pleased to announce our new selection of four post warranty service plans available from ORBIT/FR. You can now choose the quality service you deserve at the level of needs that best suits your organization. Read more...

Microwave Vision launches Dentro LRX, a Rugged Version of its Nondestructive Industrial Inspection System

Posted Apr, 10, 2012

Dentro LRX can be installed on production lines or sorting lines, to enable high performance quality control of materials as they pass through the line - Dentro LRX completes the range of nondestructive inspection tools on offer for industrial clients.

Watch the Dentro LRX demonstration video

A new vision of factory quality control

ORBIT/FR Changes its Product Colors in 2012

Posted Jan, 11, 2012

Effective as of January 2012, ORBIT/FR will change the color of its scanners and positioners line from grey to blue.
If you wish to order in the color grey please mention it in your purchase order inquiry.
You may contact us for further information at sales@microwavevision.com.

Thank you for your cooperation and understanding!

Real Time Monitoring and More with the New EME Spy 140

Posted Dec, 21, 2011

Responding to customers’ requests, we have recently enhanced the EME Spy 140 with real time visualization capabilities on an even clearer and more ergonomic interface.

New Major release for Spectrum software!

Posted Oct, 12, 2011

A major release for Spectrum software suite is to be released soon! Learn more about the V6 version of both 959 Acquisition and 959 DataPro modules.

T-DualScan Planar Near-field Tower Scanner Brochure Available

Posted Sep, 30, 2011

T-DualScan^TM is an innovative planar near-field system that offers the best compromise of accuracy, flexibility and measurement speed. The tower positioner can rotate 180° to switch easily from the single-probe set-up (0.8 - 110 GHz) to the multi-probe set-up (0.8 - 18 GHz). T-DualScan can also be offered as an upgrade to existing installations.

Read Our White Paper Entitled "Over-The-Air Testing of Diversity and MIMO Capable Terminals" on Microwave Journal Website

Posted Sep, 15, 2011

The white paper, written in collaboration with EB presents the various MIMO test technologies with an in-depth presentation of spatial fading emulation technique, OTA channel models, system calibration and analysis of results.

To meet the increased demand on high data rate applications, new wireless technologies such as LTE, LTE-Advanced, and Mobile WiMAX (Worldwide Interoperability for Microwave Access) require the use of multiple antennas in mobile terminals. Multiple-Input and Multiple-Output (MIMO) technology in a wide sense covers any multi-antenna technology, such as Spatial Multiplexing (SM), Beam Forming (BF), and spatial diversity. MIMO offers significant increases in data throughput, quality of service (QoS) and cell coverage without additional bandwidth or transmit power.

Chinese Version of MIMO Testing Solution Brochure Has Been Uploaded

Posted Aug, 30, 2011

To meet the demand of Chinese market, there comes out the Chinese version of SATIMO MIMO Testing Solution brochure.

To reach the Chinese Version of MIMO Testing Solution Brochure, please click the link.

LTE Measurement Solution Improves Measurement Test Times

Posted Aug, 16, 2011

Be sure to read the article about SATIMO and Anritsu LTE measurement solution published in the August issue of the Microwave journal.

Read the article here.

Read Our White Paper Entitled "Electronically Scanned Arrays for Fast Testing of Large Antennas" on Microwave Journal Website

Posted Jul, 18, 2011

A dual technology system, combining single probes and multi-probes, is described in a white paper entitled "Electronically Scanned Arrays for Fast Testing of Large Antennas" and published on Microwave Journal website. In this set-up, called T-DualScan, the tower positioner of the probe array can rotate 180 degrees to switch easily from the multi-probe set-up (0.5 - 18 GHz) to the single-probe set-up (0.5 - 110 GHz). The single-probe positioner is also used as a calibration arm for the probe array, allowing maximum dual-use of the equipment.

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