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Wideband Dual Polarized Probe with Interchangeable Apertures for Advanced Antenna Measurement Applications
Dual polarized probes for modern high precision measurement systems have strict requirements in terms of pattern shape, polarization purity, return loss and port-to-port isolation. A desired feature of a good probe is that the useable bandwidth should exceed that of the antenna under test so that probe mounting and alignment is performed only once during a measurement campaign. As a consequence, the probe selection/design is a trade-off between performance requirements and the usable bandwidth of the probe. Recently, a new orthomode junction (OMJ) and probe technology has been developed capable of achieving as much as 1:4 bandwidth while maintaining the high performance standards of traditional probe designs. The development, test and performance details of these probes has been reported in. At the lower frequencies the aperture diameter of these probes is about 0.7λ making them highly useful for any measurement application. However, the aperture diameter in terms of wavelengths increases with frequency and becomes close to 3λ on a 1:4 frequency range.
