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Dual Polarized Probe for Wideband Planar Near Field Measurement Applications
Wideband dual polarized probes are often used for modern high precision measurement systems. A desired feature
of a good probe is that the useable bandwidth should exceed that of the antenna under test so that probe mounting and alignment is performed only once during a measurement campaign [1]. This paper describes a new field probe taking full advantage of the 1: 4 bandwidth of the Ortho Mode Junction (OMJ) overcoming the
aperture size problem by applying different apertures on the same field probe. The apertures are circularly symmetric so the exchange of apertures can be performed rapidly without the need to repeat calibration and alignment procedures for the full probe.
