MVG Latest News

MVG's Dual Polarized Probes Featured on Cover of APS Magazine

Posted Mar, 22, 2011

MVG's dual polarized probes were featured on the cover of the December 2010 issue of Antennas & Propagation Magazine. They were showcased in an article entitled, "Dual-Polarized Corrugated Horns for Advanced Measurement Applications," written by Lars Foged, Andrea Giacomini and Roberto Morbidini.

For more, visit the IEEE APS website.

MVG will be represented by INVAS Technologies Pvt. Ltd. at 19th Convergence India 2011

Posted Mar, 20, 2011

Please come and visit at the 19th Convergence India 2011 international exhibition and conference being held at Pragati Maidan, New Delhi, during 24-26 March 2011.

INVAS Technologies will exhibit MVG's RF Safety products at booth no. 162.

For more details, pleas visit:

http://www.convergenceindia.org/index.html

Get More From Your Measurement Systems With SAM 2.15.0

Posted Mar, 14, 2011

SAM^TM is the software interface for automated OTA performance testing with StarLab and SG measurement systems. It enables measurements of both radiated power and sensitivity. This new release is a major evolution compared to SAM 2.14.

Many parts have been redesigned to offer a better user experience. The measurement speed has been improved and the sensitivity search algorithm offers new optimizations. As usual, SAM^TM follows the evolution of the wireless world and now includes support for LTE!

Join Us at ACES 2011, March 27-31 in Williamsburg, VA

Posted Mar, 14, 2011

Attend ACES 2011 in Williamsburg, VA, USA, from March 27 - 31. Per Iversen will present 2 papers:

Antenna Diagnostics and Measurement Postprocessing Using Equivalent Source Technique

Iterative Method to Reduce Truncation Errors in Partial Spherical Near-Field Antenna Measurements

For information on the conference, visit: http://aces.ee.olemiss.edu/conference/

Access 959Spectrum data in more ways!

Posted Mar, 08, 2011

Eliminate the need to program in C++. Stop manually converting data files to ASCII or .csv. Add the new File System COM Automation Server to enjoy easier access to your data and simplify your programming tasks.

Visit us at International CTIA Wireless 2011 in Orlando, Florida: Booth 462

Posted Mar, 07, 2011

The Microwave Vision Group is exhibiting in booth #462 at the International CTIA Wireless 2010 conference. The show is at the Orange County Convention Center in Orlando, Florida, USA, and runs Tuesday, March 22 - Thursday, March 24.

Stop by our exhibit for information on our new SG-3D system, a breakthrough technology in wireless device testing!

For more information on CTIA 2011, please visit the show website.

Visit us at Israeli Customer Seminar 2011, Dan Caesarea Hotel, Caesarea

Posted Mar, 02, 2011

ORBIT/FR Israel will hold a customer seminar on March 14th in the Dan Caesarea hotel in the city of Caesarea, 18 km north of our office in Emek Hefer.
The seminar will introduce the first MVG (Microwave Vision Group) integrated Hybrid Planar NF scanner system and will include a live, on-site system demonstration at the Emek Hefer facility (transportation is provided).

This system combines the best of two technologies by merging the high-accuracy precision of ORBIT/FR mechanical positioning systems with the high-speed electronic scanning of SATIMO’s multi-probe arrays.

Small systems for small antennas: increased ROI

Posted Mar, 01, 2011

It seems logical - use a small system to test small-aperture antennas. Yet, common practice is to test small antennas in full-size compact range systems that require time, manpower, and often even machinery to set up. The CR-M mini-compact range solution eliminates this time-consuming process – this portable system can be set up by one person in a matter of minutes. Rapid set up means improved test efficiency and increased ROI with no loss in accuracy.

Visit us at iWAT 2011, 7-9 March, Hong Kong

Posted Feb, 24, 2011

MVG will exhibit at the 7th IEEE International Workshop on Antenna Technology that will be held in the Royal Plaza Hotel, which is located at the center of Kowloon , Hong Kong.

Attached is the program schedule.

Additional information on the event is available:
http://www.iwat2011.hk/

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SG-3D: Meet Testing Challenges

Posted Feb, 23, 2011

Microwave Vision develops a breakthrough technology for wireless device testing: SG-3D

This concept accelerates the testing process for broadband devices (mobile phones, smartphones, laptops, digital tablets). § Measurement speed is near real-time, thanks to a combination of multiple sensors arranged in 3D inside a sphere.

Read the Press Release below and watch the video!

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