Products

ORBIT/FR Changes its Product Colors in 2012

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Effective as of January 2012, ORBIT/FR will change the color of its scanners and positioners line from grey to blue.
If you wish to order in the color grey please mention it in your purchase order inquiry.
You may contact us for further information at sales@microwavevision.com.

Thank you for your cooperation and understanding!

Real Time Monitoring and More with the New EME Spy 140

EME Spy 140

Responding to customers’ requests, we have recently enhanced the EME Spy 140 with real time visualization capabilities on an even clearer and more ergonomic interface.

New Major release for Spectrum software!

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A major release for Spectrum software suite is to be released soon! Learn more about the V6 version of both 959 Acquisition and 959 DataPro modules.

T-DualScan Planar Near-field Tower Scanner Brochure Available

T-DualScan Brochure

T-DualScanTM is an innovative planar near-field system that offers the best compromise of accuracy, flexibility and measurement speed. The tower positioner can rotate 180° to switch easily from the single-probe set-up (0.8 - 110 GHz) to the multi-probe set-up (0.8 - 18 GHz). T-DualScan can also be offered as an upgrade to existing installations.

Read Our White Paper Entitled "Over-The-Air Testing of Diversity and MIMO Capable Terminals" on Microwave Journal Website

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The white paper, written in collaboration with EB presents the various MIMO test technologies with an in-depth presentation of spatial fading emulation technique, OTA channel models, system calibration and analysis of results.

To meet the increased demand on high data rate applications, new wireless technologies such as LTE, LTE-Advanced, and Mobile WiMAX (Worldwide Interoperability for Microwave Access) require the use of multiple antennas in mobile terminals. Multiple-Input and Multiple-Output (MIMO) technology in a wide sense covers any multi-antenna technology, such as Spatial Multiplexing (SM), Beam Forming (BF), and spatial diversity. MIMO offers significant increases in data throughput, quality of service (QoS) and cell coverage without additional bandwidth or transmit power.

Chinese Version of MIMO Testing Solution Brochure Has Been Uploaded

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To meet the demand of Chinese market, there comes out the Chinese version of SATIMO MIMO Testing Solution brochure.

To reach the Chinese Version of MIMO Testing Solution Brochure, please click the link.

LTE Measurement Solution Improves Measurement Test Times

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Be sure to read the article about SATIMO and Anritsu LTE measurement solution published in the August issue of the Microwave journal.

Read the article here.

Read Our White Paper Entitled "Electronically Scanned Arrays for Fast Testing of Large Antennas" on Microwave Journal Website

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A dual technology system, combining single probes and multi-probes, is described in a white paper entitled "Electronically Scanned Arrays for Fast Testing of Large Antennas" and published on Microwave Journal website. In this set-up, called T-DualScan, the tower positioner of the probe array can rotate 180 degrees to switch easily from the multi-probe set-up (0.5 - 18 GHz) to the single-probe set-up (0.5 - 110 GHz). The single-probe positioner is also used as a calibration arm for the probe array, allowing maximum dual-use of the equipment.

SATIMO to Support LTE OTA Testing Using Anritsu MT8820C One-Box Tester

Anritsu MT8820C in SATIMO’s measurement rack (500px)

Anritsu Corporation and SATIMO announce a technology partnership to deliver Over-the-Air (OTA) LTE test solutions, including MIMO

Anritsu Corporation and SATIMO (A Microwave Vision company) are proud to announce that the Anritsu MT8820C One-Box Tester has been selected by SATIMO as a supported test solution for OTA LTE testing, including MIMO. Based on this selection, the MT8820C is integrated into the SATIMO SAM OTA performance test software.

"We are pleased to work with SATIMO to enable the wireless industry with the next generation of OTA test capability" said Kenji Tanaka, Executive Vice President of Anritsu.  “The MT8820C is a unique RF-focused test solution with broad support for 2G, 3G, and LTE testing.  When coupled with SATIMO test capability, our combined test solution will verify that new LTE devices will meet CTIA and other regulatory requirements.”

“We are happy to work with Anritsu to deliver high added-value solutions to our customers,” said Nicolas Gross, Application Director of SATIMO. “Our patented MV-ScanTM multi-probe solutions paired with the Anritsu MT8820C will allow for fast LTE OTA testing, including MIMO OTA testing.”

CR-M Mini-compact Range in Microwave Journal Product Feature Section

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An article presenting the CR-M mini-compact range has just been published in the june edition of the Microwave Journal.

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